Introduction of the Highly Accelerated Stress Test HAST Chamber
The Highly Accelerated Stress Test Chamber (HAST chamber ) represents an expedited approach to testing the reliability of electronic components, where temperature and humidity are the key environmental factors.HAST aims to assess a sample’s resistance to humidity.It does so by significantly elevating the water vapor pressure within the test chamber, well above the sample’s internal partial water vapor pressure. This method hastens the penetration of moisture into the test sample, providing a rapid assessment of its humidity resilience.
The RIUKAI RX Series HAST chamber significantly shorten the duration required for humidity testing of semiconductors.By raising the temperature above 100℃ and applying the corresponding pressure.These chambers can simulate standard humidity testing while retaining the same failure mechanisms.As a result, testing that traditionally takes weeks can be accomplished in just a few days.
Testing can be completed in days instead of weeks. Our HAST system features a more user-friendly, modern design.Regarding the RIUKAI RX Series, HAST chamber it includes the following models: RX-HAST-350、RX-HAST-450、RX-HAST-550、RX-HAST-650.
Features of the Highly Accelerated Stress Test HAST Chamber
HAST chamber represents an intensified form of accelerated humidity-resistance evaluation. In comparison to standard high-temperature/high-humidity tests (conducted at 85°C/85% RH), HAST chamber induces more pronounced moisture-induced corrosion and insulation degradation in components.
This method is primarily applied to plastic-sealed components. The accompanying table outlines the most prevalent HAST-related testing standards. Tests are conducted under specific temperature and relative humidity conditions, or pressure. Typically, the environment for HAST maintains a minimum temperature of 100°C under conditions of water vapor pressure.
HAST chamber is available in both saturated and unsaturated forms; the former typically occurs at 121℃and 100% RH, while the latter at 110, 120, or 130℃ and 85% RH. Tests involving powered-on electronic components are generally of the unsaturated type.As a test method, HAST is considerably rigorous, with an acceleration factor ranging from tens to hundreds of times more intense than conditions of 85℃ and 85% RH. Due to this extreme acceleration, it’s crucial to monitor for specific failure modes.If you want more details about HAST Chamber, please click this link.
